NXP Semiconductors
ESD TESTER
PESD5V0L1ULD
Low capacitance unidirectional ESD protection diode
4 GHz DIGITAL
R Z
450 Ω
RG 223/U
50 Ω coax
10 ×
OSCILLOSCOPE
ATTENUATOR
C Z
IEC 61000-4-2 network
C Z = 150 pF; R Z = 330 Ω
DUT
(Device
Under
Test)
50 Ω
GND
vertical scale = 10 A/div
horizontal scale = 15 ns/div
unclamped + 8 kV ESD pulse waveform
(IEC 61000-4-2 network)
GND
vertical scale = 6 V/div
horizontal scale = 100 ns/div
clamped + 8 kV ESD pulse waveform
(IEC 61000-4-2 network)
vertical scale = 10 A/div
horizontal scale = 15 ns/div
GND
GND
vertical scale = 6 V/div
horizontal scale = 100 ns/div
unclamped ? 8 kV ESD pulse waveform
clamped ? 8 kV ESD voltage waveform
Fig 7.
(IEC 61000-4-2 network)
ESD clamping test setup and waveforms
(IEC 61000-4-2 network)
006aab566
PESD5V0L1ULD
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 19 April 2011
? NXP B.V. 2011. All rights reserved.
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相关代理商/技术参数
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